Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...
Electron capture processes in ion–atom collisions constitute a critical phenomenon in understanding the interplay between charged particles and neutral atoms. In these collisions, an ion may capture ...
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