Electronic Design

ATE – Design for Test – Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Semiconductor Engineering

New Error Correcting Code And Non-Volatile Memory Options For Memory BIST

Tessent MemoryBIST from Siemens EDA provides a complete solution for at-speed test, diagnosis, repair, debug and characterization of embedded memories. Leveraging a flexible hierarchical architecture, ...
Wired

For Algorithms, Memory Is a Far More Powerful Resource Than Time

The original version of this story appeared in Quanta Magazine. One July afternoon in 2024, Ryan Williams set out to prove himself wrong. Two months had passed since he’d hit upon a startling ...
Electronic Design

Putting Memory to the Test in Nanometer Designs

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...