Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...
Integrated circuit (IC) sizes continue to grow as they meet the compute requirements of cutting-edge applications such as artificial intelligence (AI), autonomous driving, and data centers. As design ...
The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...
SoC sub-components (IPs) generally come from various sources – internal and external – and with that it has become necessary that designers ensure the RTL is testable. If the RTL has testability ...
Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...
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