Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...
Four principal methods govern the preparation of samples for XRF analysis, each representing a different trade-off between analytical quality and speed/cost of preparation. A method involving the ...
In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
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