Brookfield, Conn., July 10, 2007 – Wentworth Laboratories, Inc. today announced that a fully populated Accumax vertical probe card for flip chips/C4 bumped logic devices containing over 11,700 ...
LIVERMORE, Calif., Feb. 18, 2020 (GLOBE NEWSWIRE) -- To address the wafer test challenges of 2.5/3D advanced packaging technologies, FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and ...
PowerPlus, a high-power vertical probe card from SV Probe, can be used with high-density ICs that require probe cards with tighter pad pitches and the ability to test at a higher power level.
STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch high-current ...
MicroProbe announced today that more than 1,000 Vx and Mx vertical MEMS probe cards now are deployed worldwide in copper pillar applications. Once restricted to use in high-end logic devices, the ...
Wafer probe, one of the key processes for ensuring reliability in semiconductor manufacturing, is becoming increasingly unreliable in multi-die assemblies and at leading-edge nodes. For much of the ...
A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...
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